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Latvia’s X INFOTECH, a global system integrator for electronic identity (eID) projects and a Silicon Trust partner, will now include Elyctis know-how in the company’s offering in order to deliver a comprehensive, all-in-one solution for ePassport and eID card issuance.
X INFOTECH’s solutions perform all the necessary functions to manage the entire production workflow for efficient and secure eID document issuance, enabling a step-by-step process, which encompasses data preparation, document production management along with control over the eID document production environment and quality checks of produced eID documents.
“The successfully implemented projects in the past pave the way towards new joint eID projects in the future,” said Sergey Yeliseyev, Business Development Director, Government eID solutions, X INFOTECH. “The already-completed implementations have proven to be highly satisfactory for the customers and beneficial to Elyctis and ourselves.”
Recognized by numerous governments, eID solution suppliers and integrators worldwide, X INFOTECH has integrated the Elyctis ID BOX One reader to improve the quality-control mechanism for a number of customers, deploying eID production management.
“The fact that a reference company in the field of ePassport issuance, management and validation like X INFOTECH integrates our product is the best demonstration of our common interest in proposing a combined offer to serve the eID document markets,” said Alexandre Joly, Elyctis CEO.
The successful collaboration between X INFOTECH and Elyctis has made an important contribution to the flexibility and versatility of both companies’ offerings. By working together X INFOTECH and Elyctis are now able to provide combined market-leading solutions along with effective integration for various eID projects.
Alexander Popov, Technical Director, Government eID solutions, X INFOTECH added, “Our tests have demonstrated that Elyctis ID Box One readers deliver an added value for eID document production process, thus ensuring a superior quality of eID document issuance.”